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Instrument in design: Mini 3D

measuring range: 0,5-2000 µm

AWK 3D

measuring range: 0,2 - 31,5 mm 

2DiSA

measuring range: 0,5 - 2000 µm 

IPS K

measuring range: 0,4 - 300 µm 

IPS UA

measuring range: 0,5 - 2000 µm 

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm 

AWK D

measuring range: 50 - 4000 µm 

AWK B

measuring range: 1 - 130 mm 

IPS SAM

measuring range: 0,4 - 300 µm 

IPS L

measuring range: 0,2 - 600 µm 

IPS LCW

measuring range: 0,2 - 600 µm 

IPS U

measuring range: 0,5 - 600 µm 

IPS A

measuring range: 200 - 2000 µm 

Analyzers

Quality confirmed by ISO 9001 cert.

 

 

 

 

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KAMIKA Instruments

Infoline: +48 22 666 93 32

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KAMIKA Instruments

measuring range

Comparison of analyzers for the measurement of granulation and shape of particles.

 

Comparison of:

IPS A, IPS UA, 2DiSA U, 2DiSA, mini 3D, IPS BP, AWK C, AWK 3D, P_AWK 3D, IPS L and mini 3D L

 

 

ANALYZER’S NAME

IPS A

IPS UA

2DiSA U

2DiSA

mini 3D

IPS BP

AWK C

AWK 3D

P_AWK 3D

IPS L

mini 3D L

MEASUREMENT RANGE FOR SPHERICAL CALIBRATION.

2- 2000 mm

0,5 - 2000 mm

0,5 - 600 mm

0,5 - 2000 mm

0,5 - 2000 mm

2 - 2000 mm

0,2 - 31,5 mm

0,2 - 31,5 mm

0,1-15 mm

0,2 – 600 mm

0,2 – 600 mm

Measurement conducted in the air.

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Measurement conducted in the water.

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On-line measurement on the production line

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Ultrasonic feeder

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Automatic feeder

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x

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x

Full simulation of sieve analysis according to ELSIEVE method (in compliance with Kamika’s patent No. 205738)

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x

x

x

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Fast A/D converter – 12MHz. Frequency of scanning of 12 million times per second.

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A/D converter – 480kHz. Frequency of scanning of 500 thousand times per second

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x

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x

One dimensional measurement of particles.

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