Analyzer 

Mini 3D

A CONCEPTUAL MODEL OF ANALYZER

 

KAMIKA Instruments within several months plans to launch production of analyzers for measuring the three-dimensional shape and size of particles of micron. This project intends to implement in the competition announced on April 2, 2015, by the National Research and Development Centre (NCBiR),  for funding of projects under Activity 1.1 "R & D Projects  of enterprises", the sub-activity 1.1.1 "Industrial research and development work carried out by the company" (ie. Fast tracking).

 

Companies interested in using 3D mini analyzer please contact us.

 

 

PURPOSE

  • For laboratory measurements of shape and size distribution of particles in the air, regardless of their physical and chemical properties
  • For the measurement of particles' size of moist and sticky from 0.5 to 600 µm.
  • For the measurement of non-sticky particles' size from 2 to 2000 µm (optional).
  • For the measurement of granulation - compliance with sieve analysis
  • For the determination of specific surface area (according to the Blaine method) of the test substances (with known particle porosity).

 

INTRODUCTION
Using experience from the exploitation of  AWK 3D analyzer, commercially available for a few years, Mini 3D analyzer was developed. These are analyzers, which measure the three-dimensional particles. AWK 3D has a measuring range from a few hundred microns to 30 mm, and Mini 3D measures from a fraction of microns to 2 mm.
KAMIKA's 30 year experience in feeding micro particles in the air was included in the making of Mini 3D. There are two feeders used in the analyzer: Automatic and Ultrasonic that, together with the entire control of the feeding process, are known from the IPS AU and 2DiSA devices.

 

 

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Quality confirmed by ISO 9001 cert.

Analyzers

Instrument in design: Mini 3D

measuring range: 0,5-2000 µm

AWK 3D

measuring range: 0,2 - 31,5 mm 

2DiSA

measuring range: 0,5 - 2000 µm 

IPS K

measuring range: 0,4 - 300 µm 

IPS UA

measuring range: 0,5 - 2000 µm 

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm 

AWK D

measuring range: 50 - 4000 µm 

AWK B

measuring range: 1 - 130 mm 

IPS SAM

measuring range: 0,4 - 300 µm 

IPS L

measuring range: 0,2 - 600 µm 

IPS LCW

measuring range: 0,2 - 600 µm 

IPS U

measuring range: 0,5 - 600 µm 

IPS A

measuring range: 200 - 2000 µm 

06 March 2015

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