Instrument in design: Mini 3D

measuring range: 0,5-2000 µm

AWK 3D

measuring range: 0,2 - 31,5 mm 

2DiSA

measuring range: 0,5 - 2000 µm 

IPS K

measuring range: 0,4 - 300 µm 

IPS UA

measuring range: 0,5 - 2000 µm 

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm 

AWK D

measuring range: 50 - 4000 µm 

AWK B

measuring range: 1 - 130 mm 

IPS SAM

measuring range: 0,4 - 300 µm 

IPS L

measuring range: 0,2 - 600 µm 

IPS LCW

measuring range: 0,2 - 600 µm 

IPS U

measuring range: 0,5 - 600 µm 

IPS A

measuring range: 200 - 2000 µm 

Analyzers

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KAMIKA Instruments

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KAMIKA Instruments

measuring range

24 February 2015
Metallurgy

Granulometric analysis on opto-electronic analyzers can substitute sieve analysis according to PN-H-11077:1983 in casting industry. The previously mentioned norm establishes ruled for measurement of foundry sand of prevalence of granularity of particles bigger than 0,077 mm from sieve 0,056 to sieve 1,6 mm. It also sets rules for measurement of bentonite with prevalence of granulation particles smaller than 0,077 from the 0,040 sieve to 0,200 mm sieve.
KAMIKA analyzers enable measurement of granularity and dustiness of any material used during production of foundry masses including measurement of granulation of glass spheres.
Each measurement can be archived. After the measurement, results can be presented according to the PN83/H-11077l or counted for any set of 11 sieves.
Software of the analyzers, according to PN-H-11077:1983 norm enables counting specific surface area and indicator of shape of foundry particles.
Electronic measurement can eliminate influence of losing accuracy of sieve calibration or changes in the distribution of granularity on the measurement of specific area surface - it substitutes two methods at the same time.

 

 

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