Copyright © KAMIKA Instruments 2014 | created with WebWave CMS

Instrument in design: Mini 3D

measuring range: 0,5-2000 µm

AWK 3D

measuring range: 0,2 - 31,5 mm 

2DiSA

measuring range: 0,5 - 2000 µm 

IPS K

measuring range: 0,4 - 300 µm 

IPS UA

measuring range: 0,5 - 2000 µm 

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm 

AWK D

measuring range: 50 - 4000 µm 

AWK B

measuring range: 1 - 130 mm 

IPS SAM

measuring range: 0,4 - 300 µm 

IPS L

measuring range: 0,2 - 600 µm 

IPS LCW

measuring range: 0,2 - 600 µm 

IPS U

measuring range: 0,5 - 600 µm 

IPS A

measuring range: 200 - 2000 µm 

Analyzers

Quality confirmed by ISO 9001 cert.

 

 

 

 

What do you want to measure ?

Social media

Full listing

Check

Our instruments presented accoriding to measurement type and range.

EU projects

 

KAMIKA Instruments

Infoline: +48 22 666 93 32

Language:

  1. pl
  2. en
  3. ru

Unlimited

KAMIKA Instruments

measuring range

Metody pomiarowe

Our measurement method is based on the  theory of geometric optics and relies on the measurement of transmitted light in the parallel beam of light. Particles move in liquids or
MM SYSTEM   System for determining grain-size distribution  of mineral materials.   Purpose:   For automatic, laboratory determination of grain-size distribution of mineral materials (MM) in a range from 0,0005 up to 130
Unknown properties of laser diffraction Differentiation is necessary between "measured particle sizes range ", e.g. 0.02 mm – 2000 μm, quoted in specifications of various laser diffraction enabled measurement instruments,
Optical - electronic simulation of sieve analysis of micro-grains bigger than 0,5 μm​   SUMMARY With modern technologies the micro-grains and their proper characterization become a crucial issue in the construction