KAMIKA, Analizatory wielkości i kształtu cząstek, pyłomierze, ELSIEVE

Instrument in design: Mini 3D

measuring range: 0,5-2000 µm

AWK 3D

measuring range: 0,2 - 31,5 mm

2DiSA

measuring range: 0,5 - 2000 µm

IPS K

measuring range: 0,4 - 300 µm

IPS UA

measuring range: 0,5 - 2000 µm

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm

AWK D

measuring range: 50 - 4000 µm

AWK B

measuring range: 1 - 130 mm

IPS SAM

measuring range: 0,4 - 300 µm

IPS L

measuring range: 0,2 - 600 µm

IPS LCW

measuring range: 0,2 - 600 µm

IPS U

measuring range: 0,5 - 600 µm

IPS A

measuring range: 200 - 2000 µm

Analyzers

Quality confirmed by ISO 9001 cert.

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Our instruments presented accoriding to measurement type and range.

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KAMIKA Instruments

Infoline: +48 22 666 93 32

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KAMIKA Instruments

measuring range

Metody pomiarowe

1D basic KAMIKA method

Our measurement method is based on the theory of geometric optics and relies on the measurement of transmitted light in the parallel beam of light. Particles move in liquids or

MM System

MM SYSTEM System for determining grain-size distribution of mineral materials. Purpose: For automatic, laboratory determination of grain-size distribution of mineral materials (MM) in a range from 0,0005 up to 130

Comparison of measuring methods

Unknown properties of laser diffraction Differentiation is necessary between "measured particle sizes range ", e.g. 0.02 mm – 2000 μm, quoted in specifications of various laser diffraction enabled measurement instruments,

Elsieve

Optical - electronic simulation of sieve analysis of micro-grains bigger than 0,5 μm SUMMARY With modern technologies the micro-grains and their proper characterization become a crucial issue in the construction