KAMIKA, Analizatory wielkości i kształtu cząstek, pyłomierze, ELSIEVE

Analyzer

IPS BP

ANALYZER'S CAPABILITIES

On-line measurement of particles' size and quantity according to sieve analysis.
Sampling of the probe of grains between 2 and 2000 um, no use of probe inside the tube needed.
Returning of the material back to the transport pipe after the measurement.
Unlimited time of monitoring, full control of the granulation 24/7.
Calculating specific surface (when the microstructure is known).
Immediate identification and reaction to the problems in the production process.
Managing controlled devices through the automatic signal.

METHOD OD MEASUREMENT

Optoelectronic measurement, light scattering method.
Isokinetic measurement of probe, measurement of particles conducted in the air.
Initial measurement for 4096 dimensional classes.
Calibrated measurement for 256 equal dimensional classes or 11 arbitrary classes set by the user.
Full simulation of sieve analysis according to Elsieve method (patent no. 205738).
Coincidence analysis.
Frequency of particles' scanning: 500 kHz.
Sensor IPS compliant with ISO 13322-2:2006 norm.
Recurrence and accuracy of measurements.

PRINCIPLE OF MEASUREMENT
Measurement flow in the analyzer is isokinetically connected with the flow of the particles through transport pipe. Inlet of particles to the device is placed where the influence of centrifugal force is the strongest. Because of the isokinetic characteristics of the measurement, particles cannot be slowed down. Only in the diffuser matching adequate diameters is conducted in order to avoid excessive coincidence in the sensor. Results are available directly after the measurement and are at least as accurate as if they were obtained through traditional sieve analysis.

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Infoline: +48 22 666 93 32

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Quality confirmed by ISO 9001 cert.

Analyzers

AWK 3D

measuring range: 1 - 30 mm

Mini 3D

measuring range: 0,5-3500 µm

Mini 3D

measuring range: 0,5-3500 µm

Mini

measuring range: 0,5-3500 µm

IPS K

measuring range: 0,4 - 300 µm

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm

AWK D

measuring range: 50 - 4000 µm

AWK B

measuring range: 1 - 130 mm

IPS SAM

measuring range: 0,4 - 300 µm

11 March 2016

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