Analyzer 

AWK 3D

Instrument for determining of particles size and 3D shape.
- For laboratory measurements of grain-size distribution
- Measuring range 0,2 - 31,5 mm

 

PURPOSE:

For laboratory measurements of grain-size distribution of loose materials e.g. minerals
(aggregate, gravel, coarse sands), coal, seeds as well as nutritive granulates or synthetic
substances in a range form 0.2 up to 31,5 mm.
For full simulation of sieve analysis.
For optimisation of grinding process or mix selection.
For determining particles shape.

 

MEASUREMENT PRINCIPLE:

The analyser consist in two, crossed at right angle, measuring optical instruments. The
instruments measure simultaneously every particle that flies by measuring zone. Design of
such analyser was possible only thanks to innovative measuring method and digital
processing f optical results that are offered by KAMIKA.

The infrared or laser light beam is scattered by moving particles that are transported through
the measuring zone. An electric impulse corresponds to each participle. The impulse is
proportional to the particle size.The set of particles is initially measured with the division into 4096
channels and converted (calibrated) into 256 size classes, which are available to a use

 

MEASUREMENT PROCEDURE:

The AWK 3D analyser consist in main electronic AWK unit [1], that is connected with two independent particles’ size measuring system and measurements counter. That gives the
opportunity determining of particles shape in three dimensions.

The main electronic unit [1] is connected to computer [2]. The measuring process is controlled automatically after the measurement data are enter to the computer.
Feeding system consist in feeder [4] with vibrating chute [5]. The rotation are caused by electric engine with circular weight. Rotation of the engine (and the vibrations) are controlled
by electronic system. The range of adjustment covers 225 levels. The range of regulations include 225 levels. If the number of feeding particles is too small, the rotation of the engine
increase, if there are too much particles the rotation is decreased.

The particles are delivered to the feeding chute [7] from chute funnel [8]. The size of the funnel and the wide of the feeding chute depend on the size of measuring particles.
There is a control inlet (chimney) [9] between the feeding chute and sensor that caused the order in particles’ fall.
Between feeding chute and measuring sensor there are chimney [9], The feeder [6] pours the particles from chute funnel [8] to the container [4], that is placed
below the analyser. When the measurement is over, the analyser automatically finishes feeding and the results are worked out.

The AWK measurement results fully simulate sieve analysis according to mechanical sieves and give full information on particles shape.

 

 

 

CHARACTERISTICS:

 

-  measuring range 0,2 - 31,5 mm 
-  number of measuring classes  256
-  light source  dioda Infrared lub dioda laserowa
-  power supply  230 V AC, 50 Hz
-  operating temperature  253 do 400 K
- measuring surface 3 600 mm2

 

 

COMPLETATION:

 

- the main electronic AWK unit with A/D board
- measuring sensor with chimney
- AWK cabinet with built-in aerodynamic system
- feeder with funnel
- set of cables
- desktop computer
-  Software kit (measuring, optimising and calibrating applications)

 

We supply complete, ready-to-use instruments and measuring systems. We ensure full training courses, technical support and warranty and post-warranty service as the
producer

 

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Quality confirmed by ISO 9001 cert.

Analyzers

Instrument in design: Mini 3D

measuring range: 0,5-2000 µm

AWK 3D

measuring range: 0,2 - 31,5 mm 

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measuring range: 0,5 - 2000 µm 

IPS K

measuring range: 0,4 - 300 µm 

IPS UA

measuring range: 0,5 - 2000 µm 

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm 

AWK D

measuring range: 50 - 4000 µm 

AWK B

measuring range: 1 - 130 mm 

IPS SAM

measuring range: 0,4 - 300 µm 

IPS L

measuring range: 0,2 - 600 µm 

IPS LCW

measuring range: 0,2 - 600 µm 

IPS U

measuring range: 0,5 - 600 µm 

IPS A

measuring range: 200 - 2000 µm 

27 January 2015

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