KAMIKA, Analizatory wielkości i kształtu cząstek, pyłomierze, ELSIEVE

Nowadays, traditional measurement techniques are substituted by modern, electronic analyzers that improve accuracy and complexity of studies while subsequently reducing time of measurement.
Electronic measurement can eliminate most of human errors. It can prevent sieves from losing accuracy of calibration and does not include the influence of changes in distribution of granularity during measurement of the specific surface area - substituting two measurement methods at the same time.

IPS L

IPS L is a device for measurement of solid particles of any concentration suspended in liquid (water or water solution). It substitutes tiring areometric analysis with electronic measurement.
Measurement range: 0,2 - 500 µm

IPS U

It's an analyzer for the measurement of fine, sticky particles. It determines their shape, size and specific surface area.
Measurement of granulation of coherent fraction.
Measurement range: 0,5 - 600 µm

IPS A

It's an universal device for the measurement of dry, non sticky, loose particles in air. It measures shape, size and specific surface area of the particles.
Measurement of granulation of coherent fraction.
Measurement range: 2 - 2000 µm

AWK 3D

Analyzer for the meassurement of loose materials in laboratory conditions (for example minearal substances, like fine aggregates, thick sand). It can be used for the full simulation of sieve analysis and for three dimensional determination of particles' shape.
Measurement range: 0,2 - 31,5 mm

AWK B

AWK B is an unical device with autromatic feeder destined for the measurement of granulation thick aggregates.
Measurement range: 1 - 130 mm

MM System

It's a system that enables joining results of measurements of granulation obtained on any of our analyzers.
Measurement range: 0,2 µm - 130 mm

Geology

24 February 2015

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Infoline: +48 22 666 93 32

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Our instruments presented accoriding to measurement type and range.

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Analyzers

AWK 3D

measuring range: 1 - 30 mm

Mini 3D

measuring range: 0,5-3500 µm

Mini 3D

measuring range: 0,5-3500 µm

Mini

measuring range: 0,5-3500 µm

IPS K

measuring range: 0,4 - 300 µm

Averager

For particles up to 2 mm

IPS T

measuring range: 0,4 - 300 µm

AWK D

measuring range: 50 - 4000 µm

AWK B

measuring range: 1 - 130 mm

IPS SAM

measuring range: 0,4 - 300 µm